I had the opportunity to present a paper at the Mentor U2U in Santa Clara on Improving Yields with Advanced DFT. The paper is available from the Mentor web site if you would like to view it.
I had a number of questions afterwards from different customers asking about Design For Test guidelines, specifically in the area of boundary scan.
I am interested to know how you are incorporating boundary scan in to your designs, which boundary scan tool you are using and what feedback mechanism you use to work with Test Engineering to accommodate their requirements.
Thanks
Mark