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To achieve low power with the scan flops during shifting

Question asked by c_spvs@qti.qualcomm.com on Feb 29, 2016

During Shift, the test data is being applied to both the scan path as well as to the combinational path.

However, for Chain can we make sure to disable the test data to be loaded to the combinational path as there is no concept of Capture here.

Also, Please help me understand, using this perspective, how low-power test can be achieved, playing with Scan Flops.

 

Thanks,

Venkata.

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