How does LVS check length or width of transistors?

Version 1

    The key statement in your rules file is the TRACE PROPERTY operation.  A TRACE PROPERTY statement is required for each property, for each device you wish to trace.

     

    For each TRACE PROPERTY statement, there needs to be a property being calculated in the DEVICE statement.

     

    There are several built-in DEVICE statments that automatically calculate the most used values, such as W & L for MN and MP devices, and R for Resistors, etc.

     

    Here is an example of a "built-in" DEVICE statement:

     

    DEVICE MP  PGATE PGATE PSD PSD NWELL

     

    Even though we didn't specify it in the DEVICE statement, this device will return W and L parameters as they are calculated by default.

     

    If we want to COMPARE THEM to the source then we must have TRACE PROPERTY statements specified for them, as such:

     

    TRACE PROPERTY MP W  W  0
    TRACE PROPERTY MP L    L  0

     

    Please refer to the SVRF manual for syntax definitions of arguments.

     

    Here is an example of a DEVICE statement with the calculation spelled out manually:

     

    DEVICE MP  PGATE PGATE PSD PSD NWELL
    [
       PROPERTY W,L
       L = ((PERIMETER(PGATE) - PERIMETER_COINCIDE(PGATE,PSD)) / 2)
       W = PERIMETER_COINCIDE(PGATE,PSD) / 2
    ]

    This statement works exactly like ther simpler version, only you can add or modify the calculations.

     

    If there are properties that you want to trace with TRACE PROPERTY that are not defined in the DEVICE statement, then you have to add those and all others (including those checked int he default mode)  manually using the "built-in"  calculation language.

     

    Refer to the entire Chapter "Device Recognition" of the  Calibre Verification User's Manual for details on setting up DEVICE statements and their parameter calculations.