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Batch SI Simulation Measured at the Die?

Question asked by bman1988 on May 14, 2015
Latest reply on Mar 14, 2018 by weston_beal

Recently I found the option in the SI Oscilloscope to probe at the die instead of the pin. (I believe it is an available option because I am using IBIS models for my driver/receivers). I think this is a better place to make the measurement because it is more representative of what the receiving circuitry will see. I would like to run batch simulations measuring at the die, because when I manually checked the waveforms some signal paths that failed when measured at the pin, would have passed if measured at the die.

 

Is there a way to tell the batch SI simulation tool to probe at the die?

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