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How to check for Electrical overstress using Calibre PERC

Description:

Electrical overstress (EOS) is responsible for the vast majority of device failures and product returns. The use of multiple voltages

increases the risk of EOS, so IC designers need to increase their diligence to ensure that thin-oxide digital transistors do not have

direct or indirect paths to high-voltage portions of the design.This video shows how users can check for Electrical overstress using Calibre

PERC and use Calibre RVE to debug the results and eliminate the source of EOS failures.

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