How to check for Electrical overstress using Calibre PERC

Video created by swilliam on Oct 7, 2014

    Electrical overstress (EOS) is responsible for the vast majority of device failures and product returns. The use of multiple voltages

    increases the risk of EOS, so IC designers need to increase their diligence to ensure that thin-oxide digital transistors do not have

    direct or indirect paths to high-voltage portions of the design.This video shows how users can check for Electrical overstress using Calibre

    PERC and use Calibre RVE to debug the results and eliminate the source of EOS failures.